IEC61032Test Probe B Jointed finger probe

IEC61032Test Probe B Jointed Finger probe

key words:Test Probe B, Jointed Probe

This jointed test probe B is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.

Conforms to:

This is the "international" test probe required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Test is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and IEC 61032 and is also used for CSA and UL standards.

Notes:

Both joints shall permit movement in the same plane and the same direction through an angle of 90^o with a 0^o to +10^o tolerance.

Technical Parameters:

Kunrled finger diameter 12mm Knurled Finger length 80mm Baffle plate diameter 50mm Baffle plate length 100mm Baffle thickness 20mm