256/512M(X4/X8) DDR SDRAM 66TSOP |
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Burn-in Boards (BIBs) are used for conducting burn-in tests for screening semiconductor device quality for a variety of sensitivity attributes such as signaling, stress voltage and temperature. Simmtechs main BIB products are Static Burn-In, Dynamic Burn-In and Intelligent Burn-In. |
JEDEC standard 1.8V ...